Differences

This shows you the differences between two versions of the page.

--- inel_flat_plate_v1 [2009/09/25 04:14] – created ianmadsen
+++ inel_flat_plate_v1 [2025/09/19 15:18] (current) – external edit 127.0.0.1
@@ Line 1: / Line 1: @@
+====== Inel Flat Plate Correction ======
+Macro below performs corrections necessary for an inel flat plate system.
+<code topas>
+macro Inel_Flat_Plate_V1(alpha, alpha_val, sd, sd_val)
+	' Version by Ian Madsen CSIRO Minerals
+	' Equations for correction of intensity and sample displacement for flat plate samples
+	' in fixed incident beam geometry e.g. when using the Inel CPS120 position sensitive detector
+	' Intensity correction derived from Toraya et al. (1993)
+	' Sample displacement model derived by Ian Madsen
+	' alpha = angle between incident beam and sample surface
+	' 2Theta = (alpha + beta)
+	'   where beta  = angle between diffracted beam(s) and sample surface
+	' sd = sample displacement (in same units as detector radius)
+	' Rs = 250mm for the Inel CPS120 detector - Rs must be defined in the input file
+{
+   local alpha alpha_val
+   local sd sd_val
+   scale_pks = If(2 Th <= alpha Deg , 0, 2.0 / (1 + Sin (alpha Deg)/Sin (2 * Th - alpha Deg)));
+   th2_offset = -(Rad sd Sin (2 Th)) / (Rs Sin (alpha Deg));
+}
+</code>