A Ni standard sample was measured using the rapid acquisition PDF mode [1], with an X-ray wavelength of
0.1827 Å using a Perkin-Elmer 2D detector (2048 x 2048 pixels and 200 x 200μm pixel size) mounted orthogonal to the incident beam path with a
sample-to-detector distance of 219.431 mm. Calibration and integration of the 2D images were performed using the program Fit2D [2], and transform
to the PDF was performed using PDFgetX3 in xPDFsuite [3,4].

Measurements  were  conducted  at beamline 28-ID-2 of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE)
Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704. 

[1] P. J. Chupas, X. Qiu, J. C. Hanson, P. L. Lee, C. P. Grey and S. J. L. Billinge, J. Appl. Crystallogr., 2003, 36, 1342-1347
[2] A.  P.  Hammersley,  S.  O.  Svenson,  M.  Han  and  D. Hauserman, High Pressure Res., 1996, 14, 235–248.
[3] P. Juhas, T. Davis, C. L. Farrow and S. J. L. Billinge, J. Appl.Crystallogr., 2013, 46, 560–566.
[4] X. Yang, P. Juhas, C. L. Farrow and S. J. L. Billinge, 2014, arXiv:1402.3163v3.