jens
Dear Topas User,
as I read in another older post it is possible to apply a shape correction due to the variable divergence slit. But as I understood it is only possible for a point detector. Is there any solution to apply the EDFL correction to a line detector?
If not, are there any suggestions for a workaround? The measurements are done and unluckily i can't redo them. I could try to convert them in HighScore to a fixed slit, but I'm not sure how reliable this is.
Regards, Jens
alancoelho
Hi Jens
I'm not sure what the EDFL deter is exactly but if its a linear position sensitive detector then you could use the lpsd_th2_angular_range_degrees convolution.
cheers
alan
johnsoevans
Jens,
It's not clear if your issue is peak shapes or intensities. If you're just using an empirical peak shape then you still need to correct the data for intensity variation due to the variable slits. The line:
Variable_Divergence_Intensity
ought to work. It's good practice to check this for your diffractometer using a well known standard.
John
jens
Hi John and Alan,
you guessed right I use an empirical peak shape and want to correct the intensities. I was wondering about my results because I used the variable_divergence_intensity but there were two peaks from graphite which were poorly fitted. That was the reason I had a look at the EDFL and hoped that this would improve the fit.
I will check it with my korund standard, whether I can see differences in the fit.
Does the lpsd_th2_angular_range_degrees convolution correct the Intensity as well?
Jens
alancoelho
Jens
The lpsd_th2_angular_range_degrees convolution does correct for intensity as well was peak shape. From the Technical_Reference.PDF we have:
"The lpsd_th2_angular_range_degrees convolution corrests for peak shapes, intensities and 2Th shifts; see example LPSD-SIMULATED.INP."
cheers
alan