Focusing beam w. 2D detector

widr

Dear all,
I am dealing with data from a bit of an unconventional lab setup that combines a focusing optic (spotsize should be around 100 micrometer) with a 2D detector, both at fixed angels. Samples are thin films. Granted, it's not the most ideal XRPD setup from either the instrument or sample, but we do it like this for other reasons...

I am struggeling finding fundamental literature on such a geometry, and I was wondering if anyone here might have some experience with corrections, peak shapes, etc. or know of any relevant papers that I could look into?

Another slight issue I have with the calibration of the PONI, all calibration software I am aware of assume monochromatic wavelengths... any ideas?

Thanks

rowlesmr

John probably has a bit more experience than me, which is essentially zero, but you just could go the empirical route; collect data from a standard sample and use that to fix your instrument profile.

johnsoevans

Not much more experience I'm afraid. I agree with Matthew, and would always at least start with the empirical route. Have you found papers by e.g. Swiss Norwegian beamline at the ESRF? They might give you a route into relevant literature via citations. There are a couple of papers in Acta journals in recent years. Dimitry Chernyshov is first author on the ones I've seen.

widr

Thank you both. I will take a look and see if I can relate to ESRF work.