Hi all,
we suspect that we are working outside the constant scattering volume condition, but are wondering how to test this. The sample holder is a low background Si chip, measurements are performed in Bragg-Brentano geometry. The sample is applied as a thin powder film, dispersed in some drops of ethanol, then smeared out and dried. How can we determine whether we are within the condition of having a roughly constant scattering volume?
If we are not in that condition, what type of correction should we apply?
Best, Daniel