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====== Inel Flat Plate Correction ======
macro Inel_Flat_Plate_V2(alpha, alpha_v, sd, sd_v)
' Version by Matthew Rowles CSIRO Minerals
' Equations for correction of intensity and sample displacement for flat plate samples
' in fixed incident beam geometry e.g. when using the Inel CPS120 position sensitive detector
' Intensity correction derived from Toraya et al. (1993)
' Sample displacement model derived by Ian Madsen
' 2Theta = (alpha + beta)
' where beta = angle between diffracted beam(s) and sample surface
' Rs = 250mm for the Inel CPS120 detector - Rs must be defined in the input file
{
#m_argu alpha ' alpha = angle between incident beam and sample surface
#m_argu sd ' sd = displacement of the sample (in same units as detector radius)
If_Prm_Eqn_Rpt(alpha, alpha_v, min 0.0001 max 90)
If_Prm_Eqn_Rpt(sd, sd_v, min -1 max 1)
scale_pks =
IF (2 Th) < CeV(alpha, alpha_v) Deg THEN
0
ELSE
2 / (1 + (Sin(CeV(alpha, alpha_v) Deg) / Sin(2 Th - CeV(alpha, alpha_v) Deg)))
ENDIF;
th2_offset =
IF CeV(sd, sd_v) == 0 THEN
0
ELSE
- Rad (CeV(sd, sd_v) Sin(2 Th)) / (Rs Sin(CeV(alpha, alpha_v) Deg))
ENDIF;
}