Differences

This shows you the differences between two versions of the page.

--- inel_flat_plate_v2 [2009/09/25 08:01] – johnsoevans
+++ inel_flat_plate_v2 [2025/09/19 15:18] (current) – external edit 127.0.0.1
@@ Line 1: / Line 1: @@
+====== Inel Flat Plate Correction ======
+<code topas>
+macro Inel_Flat_Plate_V2(alpha, alpha_v, sd, sd_v)
+	' Version by Matthew Rowles CSIRO Minerals
+	' Equations for correction of intensity and sample displacement for flat plate samples
+	' in fixed incident beam geometry e.g. when using the Inel CPS120 position sensitive detector
+	' Intensity correction derived from Toraya et al. (1993)
+	' Sample displacement model derived by Ian Madsen
+	' 2Theta = (alpha + beta)
+	'   where beta  = angle between diffracted beam(s) and sample surface
+	' Rs = 250mm for the Inel CPS120 detector - Rs must be defined in the input file
+{
+   #m_argu alpha    ' alpha = angle between incident beam and sample surface
+   #m_argu sd       ' sd = displacement of the sample (in same units as detector radius)
+	If_Prm_Eqn_Rpt(alpha, alpha_v, min 0.0001 max 90)
+   If_Prm_Eqn_Rpt(sd, sd_v, min -1 max 1)
+	scale_pks =
+		IF (2 Th) < CeV(alpha, alpha_v) Deg THEN
+
+		ELSE
+/ (1 + (Sin(CeV(alpha, alpha_v) Deg) / Sin(2 Th - CeV(alpha, alpha_v) Deg)))
+		ENDIF;
+	th2_offset =
+		IF CeV(sd, sd_v) == 0 THEN
+		ELSE
+			- Rad (CeV(sd, sd_v) Sin(2 Th)) / (Rs Sin(CeV(alpha, alpha_v) Deg))
+		ENDIF;
+}
+</code>